XRF Analysis is one of the most reliable techniques for elemental analysis across all sample types – whether liquid, solid or powder. Bruker’s XRF spectrometers offer outstanding accuracy and precision, paired with quick and easy sample preparation. They enable the detection of elements ranging from Beryllium (Be) to Uranium (U), covering concentration levels from 100% down to sub-ppm levels.

X-ray diffraction (XRD) is a technique used to characterize the crystallographic properties of materials by analyzing the diffraction patterns resulting from the interaction between X-rays and crystalline specimens. This analysis provides valuable information such as lattice parameters, structural configuration, and crystal alignment, which aids in optimizing material synthesis.

X-ray microscopy is defined as a technique that utilizes high energy synchrotron X-rays for nondestructive examination of internal structures within a sample, providing 3D images and revealing features from nanometers to millimeters without the need for sectioning.